Title :
Effects of sulfur incorporation into absorbers of CIGS solar cells studied by numerical analysis
Author :
Huang, Chia-Hua ; Cheng, Hung-Lung
Author_Institution :
Dept. of Electr. Eng., Nat. Dong Hwa Univ., Hualien, Taiwan
Abstract :
The performance of Cu(In, Ga)Se2 (CIGS) solar cells with the incorporation of sulfur into the surface region of the absorbers has been studied by numerical simulation. The impacts of sulfur contents and thickness of sulfurized layers in the surface region of absorbers on the performance were evaluated. The results show that the incorporation of sulfur in the CIGS films enhances the open-circuit voltage (VOC), but concurrently leads to the reduction in short-circuit current density (JSC). The S/(S+Se) ratios of below 0.2 could improve the cell performance for all thickness of sulfurized layers in this study. For S/(S+Se) ratios of 0.1-0.5, the thickness of 200nm was suggested to enhance the efficiency of devices.
Keywords :
copper compounds; current density; gallium compounds; indium compounds; numerical analysis; semiconductor thin films; short-circuit currents; solar cells; sulphur; ternary semiconductors; CIGS solar cells; CuGaSe2; CuInSe2; S; absorber surface region; numerical analysis; numerical simulation; open-circuit voltage; short-circuit current density; size 200 nm; sulfur incorporation effect; sulfurized layer thickness; Films; Numerical models; Numerical simulation; Performance evaluation; Photonic band gap; Photovoltaic cells; Thyristors; CIGS solar cells; Selenization; Surface sulfurization; Thin films;
Conference_Titel :
Numerical Simulation of Optoelectronic Devices (NUSOD), 2012 12th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-1602-6
DOI :
10.1109/NUSOD.2012.6316545