DocumentCode
3497714
Title
Effects of sulfur incorporation into absorbers of CIGS solar cells studied by numerical analysis
Author
Huang, Chia-Hua ; Cheng, Hung-Lung
Author_Institution
Dept. of Electr. Eng., Nat. Dong Hwa Univ., Hualien, Taiwan
fYear
2012
fDate
28-31 Aug. 2012
Firstpage
117
Lastpage
118
Abstract
The performance of Cu(In, Ga)Se2 (CIGS) solar cells with the incorporation of sulfur into the surface region of the absorbers has been studied by numerical simulation. The impacts of sulfur contents and thickness of sulfurized layers in the surface region of absorbers on the performance were evaluated. The results show that the incorporation of sulfur in the CIGS films enhances the open-circuit voltage (VOC), but concurrently leads to the reduction in short-circuit current density (JSC). The S/(S+Se) ratios of below 0.2 could improve the cell performance for all thickness of sulfurized layers in this study. For S/(S+Se) ratios of 0.1-0.5, the thickness of 200nm was suggested to enhance the efficiency of devices.
Keywords
copper compounds; current density; gallium compounds; indium compounds; numerical analysis; semiconductor thin films; short-circuit currents; solar cells; sulphur; ternary semiconductors; CIGS solar cells; CuGaSe2; CuInSe2; S; absorber surface region; numerical analysis; numerical simulation; open-circuit voltage; short-circuit current density; size 200 nm; sulfur incorporation effect; sulfurized layer thickness; Films; Numerical models; Numerical simulation; Performance evaluation; Photonic band gap; Photovoltaic cells; Thyristors; CIGS solar cells; Selenization; Surface sulfurization; Thin films;
fLanguage
English
Publisher
ieee
Conference_Titel
Numerical Simulation of Optoelectronic Devices (NUSOD), 2012 12th International Conference on
Conference_Location
Shanghai
ISSN
2158-3234
Print_ISBN
978-1-4673-1602-6
Type
conf
DOI
10.1109/NUSOD.2012.6316545
Filename
6316545
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