DocumentCode :
3497815
Title :
High reliability metal insulator metal capacitors for silicon germanium analog applications
Author :
Stein, Ken ; Kocis, Joe ; Hueckel, Gary ; Eld, Ernie ; Bartush, Tom ; Groves, Rob ; Greco, Nancy ; Harame, Dave ; Tewksbury, Ted
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
fYear :
1997
fDate :
28-30 Sep 1997
Firstpage :
191
Lastpage :
194
Abstract :
In this work, a novel “planar” metal-insulator-metal capacitor (MIMCAP) process is introduced, integrated in a Silicon Germanium (SiGe) HBT process, which has excellent yield, reliability and repeatability. The MIMCAP was characterized for DC and AC parametrics, and stressed at elevated biases and temperatures to assess reliability. An equivalent circuit and SPICE model were generated, and good agreement was found between the simulated and measured characteristics. A MIMCAP with high device/bottom plate capacitance ratio, excellent yield and reliability are critical needs in high quality passives for the fabrication of advanced analog mixed/signal circuits with on-chip components. In collaboration with Analog Devices, SiGe HBT voltage controlled oscillators (VCO) circuits were designed with both MIMCAP and substrate capacitor controls to demonstrate the leverage of this novel passive element
Keywords :
Ge-Si alloys; MIM devices; analogue integrated circuits; capacitors; equivalent circuits; mixed analogue-digital integrated circuits; reliability; HBT VCO circuits; SPICE model; SiGe; SiGe HBT process; analog mixed/signal circuits; equivalent circuit; high reliability MIM capacitors; metal-insulator-metal capacitors; planar MIMCAP process; voltage controlled oscillators; Germanium silicon alloys; Heterojunction bipolar transistors; Insulation; Integrated circuit reliability; Integrated circuit yield; MIM capacitors; Metal-insulator structures; Silicon germanium; Temperature; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 1997. Proceedings of the
Conference_Location :
Minneapolis, MN
ISSN :
1088-9299
Print_ISBN :
0-7803-3916-9
Type :
conf
DOI :
10.1109/BIPOL.1997.647433
Filename :
647433
Link To Document :
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