Title :
Fabrication and characterization of 3D micro-plasma field effect transistors
Author :
Chowdhury, Fahmida K. ; Yuying Zhang ; Tabib-Azar, Massood
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Utah, Salt Lake City, UT, USA
Abstract :
We report the design, fabrication and electrical characterization of novel three dimensional Micro-plasma Field Effect Transistor (MOPFET) devices that operate inside atmospheric RF helium plasma. Current versus voltage characterization of MOPFETs are demonstrated in this paper. High transconductance and reliable gate control over Ids can be obtained from coplanar and 3D MOPFETs. COMSOL simulation is used here to demonstrate the operation principles of MOPFETs. For micro-plasma FETs electrons and ions act as charge carriers to conduct current, instead of electrons and holes, as in, traditional semiconductor FETs. Therefore, MOPFETs have advantages over semiconductor FETs in extreme conditions, such as at high temperatures and in high ionizing radiation such as applications in space exploration and in distressed nuclear reactors.
Keywords :
field effect transistors; microfabrication; plasma devices; semiconductor device reliability; 3D MOPFET device; COMSOL simulation; atmospheric RF helium plasma; coplanar MOPFET; electrical characterization; gate control reliable; microfabrication; microplasma FET electron; nuclear reactor; semiconductor FET; three dimensional microplasma field effect transistor device; transconductance; voltage characterization; Charge carriers; Electrodes; Fabrication; Field effect transistors; Ions; Logic gates; Plasmas;
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2013 IEEE 26th International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4673-5654-1
DOI :
10.1109/MEMSYS.2013.6474331