Title :
Evaluation and comparison of structural test methodologies for analogue and mixed signal circuits
Author :
Bell, I.M. ; Spinks, S.J.
Author_Institution :
Hull Univ., UK
Abstract :
In recent years a number of structural (defect orientated) test methodologies have been proposed for analogue and mixed signal circuits. They potentially provide shorter test times and increased fault coverage, including detection of reliability problems. To compare the efficiency of such methodologies fault simulation is often used. In this paper we will consider the difficulties involved in this process and present the results obtained from some comparative studies
Keywords :
analogue integrated circuits; automatic testing; circuit simulation; fault simulation; integrated circuit reliability; integrated circuit testing; life testing; mixed analogue-digital integrated circuits; analogue ICs; defect orientated test methodologies; fault coverage; fault simulation; mixed signal circuits; reliability problems; structural test methodologies; test times; Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Current supplies; Electrical fault detection; Fault detection; Frequency; Monitoring; Test equipment;
Conference_Titel :
Electronics, Circuits and Systems, 1998 IEEE International Conference on
Conference_Location :
Lisboa
Print_ISBN :
0-7803-5008-1
DOI :
10.1109/ICECS.1998.814915
