Title : 
A framework for the design of new line parameterizations
         
        
            Author : 
Hu, Zhanyi ; Wang, Wei ; Yang, Chang-Jiang ; De Ma, Song
         
        
            Author_Institution : 
Inst. of Autom., Acad. Sinica, Beijing, China
         
        
        
        
        
        
            Abstract : 
Based on four criteria, namely uniqueness, boundedness, uniformness and recursiveness, a framework for the design of new line parameterizations is introduced. It is shown that there does not exist a line parameterization which could satisfy all the above four criteria, and that the line parameterization, formulated as c=ax+(a0-|a|)y a∈[-a0,a0) where a 0 is an arbitrary positive number, can not only satisfy the uniqueness, boundedness, and recursiveness conditions, but it can also achieve the best goodness to the uniformness one
         
        
            Keywords : 
edge detection; parameter estimation; boundedness; computer vision; line parameterizations; recursiveness; uniformness; uniqueness; Automation; Computer vision; Image sampling; Laboratories; Parallel processing; Pattern recognition; Probability density function; Quantization; Space technology;
         
        
        
        
            Conference_Titel : 
Signal Processing, 1996., 3rd International Conference on
         
        
            Conference_Location : 
Beijing
         
        
            Print_ISBN : 
0-7803-2912-0
         
        
        
            DOI : 
10.1109/ICSIGP.1996.566224