• DocumentCode
    3498244
  • Title

    Simulation of asymmetric faults of a five-phase induction machine used in naval applications

  • Author

    Heising, Carsten ; Oettmeier, Martin ; Bartelt, Roman ; Fang, Jie ; Staudt, Volker ; Steimel, Andreas

  • Author_Institution
    Ruhr-Univ. Bochum, Bochum, Germany
  • fYear
    2009
  • fDate
    3-5 Nov. 2009
  • Firstpage
    1298
  • Lastpage
    1303
  • Abstract
    In naval applications high availability is a must. Therefore fault scenarios of naval drives and power-supply systems have to be simulated in detail. In order to model the physical behaviour of complex induction machines in an adequate way including asymmetric faults which are not featured by any simplified single-phase ECD, a set of differential equations has to be formulated. Though the presented approach is applied to a five-phase induction machine, it is a matter of fact, that the simulation approach can also be applied to any other kind of polyphase machine, e.g. induction machines with seven-phases or with double-star stator windings. After a brief introduction of the used simulation concept and the modeling approach for complex motor drives, the excellent performance is demonstrated with the simulation of a five-phase induction machine emulating three different failure modes occurring in one inverter phase leg: line interruption, frozen inverter state and IGBT gate defect.
  • Keywords
    differential equations; induction motor drives; power supplies to apparatus; IGBT gate defect; asymmetric faults; complex motor drives; differential equations; double-star stator windings; five-phase induction machine; frozen inverter state; line interruption; naval drives; power-supply systems; single-phase ECD; AC motors; Anisotropic magnetoresistance; Current measurement; Frequency; Induction machines; Pulse width modulation inverters; Rotors; Stators; Synchronous motors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE
  • Conference_Location
    Porto
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-4648-3
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2009.5414647
  • Filename
    5414647