DocumentCode :
3498367
Title :
Knife-edge scanning microscopy for connectomics research
Author :
Choe, Yoonsuck ; Mayerich, David ; Kwon, Jaerock ; Miller, Daniel E. ; Chung, Ji Ryang ; Sung, Chul ; Keyser, John ; Abbott, Louise C.
Author_Institution :
Dept. of Comput. Sci. & Eng., Texas A&M Univ., College Station, TX, USA
fYear :
2011
fDate :
July 31 2011-Aug. 5 2011
Firstpage :
2258
Lastpage :
2265
Abstract :
In this paper, we will review a novel microscopy modality called Knife-Edge Scanning Microscopy (KESM) that we have developed over the past twelve years (since 1999) and discuss its relevance to connectomics and neural networks research. The operational principle of KESM is to simultaneously section and image small animal brains embedded in hard polymer resin so that a near-isotropic, sub-micrometer voxel size of 0.6 μm × 0.7 μm × 1.0 μm can be achieved over ~1 cm3 volume of tissue which is enough to hold an entire mouse brain. At this resolution, morphological details such as dendrites, dendritic spines, and axons are visible (for sparse stains like Golgi). KESM has been successfully used to scan whole mouse brains stained in Golgi (neuronal morphology), Nissl (somata), and India ink (vasculature), providing unprecedented insights into the system-level architectural layout of microstructures within the mouse brain. In this paper, we will present whole-brain-scale data sets from KESM and discuss challenges and opportunities posed to connectomics and neural networks research by such detailed yet system-level data.
Keywords :
brain; neural nets; neurophysiology; animal brain; axon; connectomics; dendrites; dendritic spine; hard polymer resin; knife-edge scanning microscopy; microscopy modality; mouse brain; neural network; neuronal morphology; somata; system-level architectural layout; vasculature; Data visualization; Image reconstruction; Image resolution; Mice; Microscopy; Three dimensional displays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks (IJCNN), The 2011 International Joint Conference on
Conference_Location :
San Jose, CA
ISSN :
2161-4393
Print_ISBN :
978-1-4244-9635-8
Type :
conf
DOI :
10.1109/IJCNN.2011.6033510
Filename :
6033510
Link To Document :
بازگشت