Title :
PARCRIPT: a very fast combinational fault simulator
Author :
Jou, Jer Min ; Chen, Shung-Chih
Author_Institution :
Dept. of Electr. Eng., National Cheng-Kung Univ., Tainan, Taiwan
Abstract :
A new combinational fault simulator, PARCRIPT, which combines the merits of the concept of the parallel fault simulation and the efficiency of the critical path tracing (CRIPT), is presented. The key idea of PARCRIPT is to simultaneously propagate the criticalities of the potential stems to determine whether a potential stem is critical. Critical path tracing then traces from the critical potential stem to find the detected faults inside the fanout-free region. Experimental results show that PARCRIPT run 2-5 times faster than PROOFS for 10 combinational benchmark circuits.
Keywords :
VLSI; circuit analysis computing; combinatorial circuits; critical path analysis; logic CAD; logic testing; PARCRIPT; VLSI; critical path tracing; fanout-free region; parallel fault simulation; very fast combinational fault simulator; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Electrical fault detection; Fault detection; Fault diagnosis; Very large scale integration;
Conference_Titel :
VLSI Technology, Systems, and Applications, 1993. Proceedings of Technical Papers. 1993 International Symposium on
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-0978-2
DOI :
10.1109/VTSA.1993.263626
