DocumentCode
3498703
Title
Efficient Hole Detour Scheme for Geographic Routing in Wireless Sensor Networks
Author
Yu, Fucai ; Park, Soochang ; Tian, Ye ; Jin, Minsuk ; Kim, Sang-Ha
Author_Institution
Dept. of Comput. Eng., Chungnam Nat. Univ., Daejeon
fYear
2008
fDate
11-14 May 2008
Firstpage
153
Lastpage
157
Abstract
Geographic routing has been addressed in many literatures of ad hoc sensor networks due to its efficiency and scalability. Void areas (holes) bring Geographic routing some problems such as data congestion and excessive energy consumption of hole boundary nodes. Holes are hardly avoided in wireless sensor networks due to various actual geographical environments, e.g., puddles, buildings or obstacles, or uneven energy consumption, even physical destruction. To bypass a hole, most existing geographic routing protocols tend to route data packets along the boundary of the hole by perimeter routing scheme. This scheme, on one hand, consumes more energy of the nodes on the boundary of the hole, thus possibly enlarging the hole, we call this hole diffusion problem; on the other hand, it may incur data congestion if multiple communication sessions are bypassing the hole simultaneously. In this paper, we propose efficient hole detour scheme to solve the hole problems faced by geographic routing in wireless sensor networks. Simulation results show that the proposed protocol is superior to other protocols in terms of packet deliver ratio, control overhead, average delivery delay, and energy consumption.
Keywords
ad hoc networks; routing protocols; wireless sensor networks; ad hoc sensor networks; data congestion; excessive energy consumption; geographic routing protocols; hole detour scheme; wireless sensor networks; Communication system control; Computer networks; Delay; Energy consumption; IEEE news; Network topology; Power engineering and energy; Routing protocols; Scalability; Wireless sensor networks;
fLanguage
English
Publisher
ieee
Conference_Titel
Vehicular Technology Conference, 2008. VTC Spring 2008. IEEE
Conference_Location
Singapore
ISSN
1550-2252
Print_ISBN
978-1-4244-1644-8
Electronic_ISBN
1550-2252
Type
conf
DOI
10.1109/VETECS.2008.44
Filename
4525600
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