DocumentCode
3498837
Title
New measurement method for two-port noise parameters
Author
Pasquet, D. ; Andrei, C. ; Lesenechal, D. ; Descamps, P.
Author_Institution
LaMIPS, Caen, France
fYear
2010
fDate
21-26 June 2010
Firstpage
1
Lastpage
3
Abstract
The noise parameters are useful for the design of low noise amplifiers. They are usually deducted by the measurement of the noise figure that varies with the impedance presented at the input.
Keywords
low noise amplifiers; noise measurement; semiconductor device noise; impedance; low noise amplifier; noise figure measurement method; two-port noise parameter; Nickel;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW), 2010 International Kharkov Symposium on
Conference_Location
Kharkiv
Print_ISBN
978-1-4244-7900-9
Type
conf
DOI
10.1109/MSMW.2010.5545989
Filename
5545989
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