Title :
Monitoring glass transition of epoxy encapsulant using thermal analysis techniques
Author :
Chew, Spencer ; Lim, Edward
Author_Institution :
Inst. of Microelectron., Singapore
Abstract :
Glass transition temperature, better known by the acronym Tg in the electronic industry, is a frequently used parameter to depict the degree of cure of epoxy encapsulant. Tg can be measured by a variety of thermal analysis techniques and often vary as the optimised conditions differ between the different techniques. This paper investigates and reports the glass transition temperature range of a cured epoxy encapsulant using differential scanning calorimetry, thermomechanical analysis and dynamic mechanical analysis
Keywords :
encapsulation; glass transition; polymers; thermal analysis; differential scanning calorimetry; dynamic mechanical analysis; epoxy encapsulant; glass transition; thermal analysis; thermomechanical analysis; Calorimetry; Dielectric loss measurement; Dielectric measurements; Electronics industry; Glass; Loss measurement; Mechanical variables measurement; Monitoring; Permittivity measurement; Temperature;
Conference_Titel :
Semiconductor Electronics, 1996. ICSE '96. Proceedings., 1996 IEEE International Conference on
Conference_Location :
Penang
Print_ISBN :
0-7803-3388-8
DOI :
10.1109/SMELEC.1996.616495