DocumentCode :
349891
Title :
Development of a generic equipment manager for semiconductor manufacturing
Author :
Yang, Haw-Ching ; Cheng, Fan-tien ; Huang, David
Author_Institution :
Dept. of Autom. Eng., Dayeh Univ., Changhua, Taiwan
Volume :
1
fYear :
1999
fDate :
1999
Firstpage :
727
Abstract :
The purpose of this research is to develop the generic equipment manager (GEMG) which can either operate alone or be integrated with the manufacturing execution system (MES). In order to achieve generality and reusability, the governing rules of the GEMG are divided into three independent portions: system/framework rules, business rules, and equipment rules. The system/framework rules specify the requirements to become a pluggable component of MES framework. The business rules are company-dependent and are equipment-independent. A controller application module, which drives desired scenarios, is developed to realize the business rules. The equipment rules are equipment-dependent and are company-independent. These equipment rules are achieved by the module of equipment driver which compiles appropriate behaviors. Considering reusability, the so-called generic equipment interface (GEI) messages which are fine-grained, company-independent and equipment-independent are developed to be the communication messages between the controller application and equipment driver, therefore reusability is easily accomplished. Several examples are shown to demonstrate the generality and reusability of the GEMG
Keywords :
device drivers; distributed object management; message passing; production control; semiconductor device manufacture; GEI messages; GEMG; MES framework; business rules; communication messages; controller application; controller application module; equipment driver; equipment rules; generic equipment interface messages; generic equipment manager; governing rules; manufacturing execution system; pluggable component; reusability; semiconductor manufacturing; system/framework rules; Automatic control; Communication system control; Computer aided manufacturing; Computerized monitoring; Condition monitoring; Electronics industry; Engineering management; Manufacturing automation; Production facilities; Semiconductor device manufacture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Technologies and Factory Automation, 1999. Proceedings. ETFA '99. 1999 7th IEEE International Conference on
Conference_Location :
Barcelona
Print_ISBN :
0-7803-5670-5
Type :
conf
DOI :
10.1109/ETFA.1999.815426
Filename :
815426
Link To Document :
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