Title :
Toward a practical methodology for the statistical design of complex integrated circuit products
Author :
Duvall, Steven G.
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
The author discusses statistical, as opposed to worst case, approaches to the design of complex integrated circuit products. Recent approaches and why they have failed to be widely adopted are reviewed. The author concludes with a discussion of a practical approach to complex integrated circuit design combining worst case and statistical methods.
Keywords :
design engineering; integrated circuit technology; semiconductor process modelling; complex integrated circuit products; design methodology; modelling; process effects; statistical design; uncertainty; Design methodology; Fluctuations; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit synthesis; MOS devices; Manufacturing processes; Process design; Robustness; Uncertainty;
Conference_Titel :
VLSI Technology, Systems, and Applications, 1993. Proceedings of Technical Papers. 1993 International Symposium on
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-0978-2
DOI :
10.1109/VTSA.1993.263639
