DocumentCode :
3499125
Title :
Improving validation coverage metrics to account for limited observability
Author :
Lisherness, Peter ; Cheng, Kwang-Ting Tim
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of California, Santa Barbara, CA, USA
fYear :
2012
fDate :
Jan. 30 2012-Feb. 2 2012
Firstpage :
292
Lastpage :
297
Abstract :
In both pre-silicon and post-silicon validation, the detection of design errors requires both stimulus capable of activating the errors and checkers capable of detecting the behavior as erroneous. Most functional and code coverage metrics evaluate only the activation component of the testbench and ignore propagation and detection. In this paper, we summarize our recent work in developing improved metrics that account for propagation and/or detection of design errors. These works include tools for observability-enhanced code coverage and mutation analysis of high-level designs as well as an analytical method, Coverage Discounting, which adds checker sensitivity to arbitrary functional coverage metrics.
Keywords :
high level synthesis; observability; program compilers; program debugging; program testing; program verification; activation component; arbitrary functional coverage metrics; behavior detection; checker sensitivity; code coverage metrics; coverage discounting; design errors; functional metrics; high-level designs; limited observability; mutation analysis; observability-enhanced code coverage; post-silicon validation; pre-silicon validation; testbench; validation coverage metrics; Adaptation models; Analytical models; Logic gates; Measurement; Observability; Runtime; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific
Conference_Location :
Sydney, NSW
ISSN :
2153-6961
Print_ISBN :
978-1-4673-0770-3
Type :
conf
DOI :
10.1109/ASPDAC.2012.6164962
Filename :
6164962
Link To Document :
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