Title :
The outlook of flash EPROM technology
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
The author gives a brief review of flash technologies and discusses the three dominant flash technologies. The challenge of technology scaling is discussed. Flash technology development is an exciting area because it involves not only process technology, but also device, design, test and system technologies. All areas have to work well together to make flash a success.
Keywords :
EPROM; VLSI; integrated memory circuits; EEPROM; flash EPROM technology; stacked gate; technology scaling; Computer architecture; Consumer electronics; Costs; EPROM; Flash memory; Industrial electronics; Integrated circuit technology; Random access memory; Technological innovation; Tunneling;
Conference_Titel :
VLSI Technology, Systems, and Applications, 1993. Proceedings of Technical Papers. 1993 International Symposium on
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-0978-2
DOI :
10.1109/VTSA.1993.263647
