DocumentCode
3499148
Title
The outlook of flash EPROM technology
Author
Lai, Stefan
Author_Institution
Intel Corp., Santa Clara, CA, USA
fYear
1993
fDate
1993
Firstpage
147
Lastpage
151
Abstract
The author gives a brief review of flash technologies and discusses the three dominant flash technologies. The challenge of technology scaling is discussed. Flash technology development is an exciting area because it involves not only process technology, but also device, design, test and system technologies. All areas have to work well together to make flash a success.
Keywords
EPROM; VLSI; integrated memory circuits; EEPROM; flash EPROM technology; stacked gate; technology scaling; Computer architecture; Consumer electronics; Costs; EPROM; Flash memory; Industrial electronics; Integrated circuit technology; Random access memory; Technological innovation; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, Systems, and Applications, 1993. Proceedings of Technical Papers. 1993 International Symposium on
Conference_Location
Taipei, Taiwan
ISSN
1524-766X
Print_ISBN
0-7803-0978-2
Type
conf
DOI
10.1109/VTSA.1993.263647
Filename
263647
Link To Document