DocumentCode :
3499326
Title :
Through-silicon-via-induced obstacle-aware clock tree synthesis for 3D ICs
Author :
Zhao, Xin ; Lim, Sung Kyu
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2012
fDate :
Jan. 30 2012-Feb. 2 2012
Firstpage :
347
Lastpage :
352
Abstract :
In this paper, we present an obstacle-aware clock tree synthesis method for through-silicon-via (TSV)-based 3D ICs. A unique aspect of this problem lies in the fact that various types of TSVs become obstacles during 3D clock routing including signal, power/ground, and clock TSVs. Some of these TSVs become placement obstacles, i.e., they interfere with clock buffers and clock TSVs; while other TSVs become routing obstacles, i.e., clock wires cannot route through them. Thus, the key is to perform TSV-induced obstacle-aware 3D clock routing under the following goals: (1) clock TSVs and clock buffers are located while avoiding overlap with placement obstacles; (2) clock wires are routed while avoiding routing obstacles; and (3) clock skew and slew constraints are satisfied. Related experiments show that our TSV-obstacle-aware clock tree does not sacrifice wirelength or clock power too much while avoiding various TSV-induced obstacles.
Keywords :
clocks; network routing; three-dimensional integrated circuits; 3D integrated circuit; TSV-induced obstacle-aware 3D clock routing; clock buffer; clock power; clock skew constraint; clock slew constraint; clock wire; through-silicon-via-based 3D IC; through-silicon-via-induced obstacle-aware clock tree synthesis; Benchmark testing; Clocks; Merging; Routing; Three dimensional displays; Through-silicon vias; Topology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific
Conference_Location :
Sydney, NSW
ISSN :
2153-6961
Print_ISBN :
978-1-4673-0770-3
Type :
conf
DOI :
10.1109/ASPDAC.2012.6164971
Filename :
6164971
Link To Document :
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