Title :
Compact Modeling of High Frequency Correlated Noise in HBTs
Author :
Sakalas, P. ; Herricht, J. ; Chakravorty, A. ; Schroter, M.
Abstract :
A compact model solution, consistent with the system theory for correlated base and collector shot noise sources, is derived and implemented in the bipolar transistor model HICUM using Verilog-A. Compiled (with Tiburon) Verilog-A model is simulated using ADS 2004A and the results are tested against measured noise parameters for high-frequency (fT at 150 GHz) SiGe HBTs. Very good agreement between simulated and measured data is obtained
Keywords :
Ge-Si alloys; heterojunction bipolar transistors; semiconductor device models; semiconductor device noise; HICUM; SiGe; Verilog-A; correlation; heterojunction bipolar transistors; noise modeling; shot noise; Bipolar transistors; Circuit noise; Circuit simulation; Computational modeling; Frequency; Germanium silicon alloys; Hardware design languages; Integrated circuit noise; Low-frequency noise; Silicon germanium; HICUM; Noise; SiGe Heterojunction bipolar transistors; Verilog-A; correlation; noise modeling; shot noise;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2006
Conference_Location :
Maastricht
Print_ISBN :
1-4244-0458-4
Electronic_ISBN :
1088-9299
DOI :
10.1109/BIPOL.2006.311175
