• DocumentCode
    3499585
  • Title

    BJT Base and Emitter Resistance Extraction from DC Data

  • Author

    McAndrew, Colin C.

  • Author_Institution
    Freescale Semicond., Tempe, AZ
  • fYear
    2006
  • fDate
    8-10 Oct. 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a new technique to determine the base and emitter resistances of BJTs. The method is based on analysis of intrinsic and extrinsic conductances, which can be calculated from forward Gummel DC data at different Vcb, and explicitly accounts for the difference between DC and AC values of base resistance
  • Keywords
    bipolar transistors; electric resistance measurement; BJT base resistance extraction; BJT emitter resistance extraction; Gummel DC data; extrinsic conductances; intrinsic conductances; Bipolar transistors; Capacitance; Circuits; Current measurement; Data mining; Electrical resistance measurement; Frequency; Gain measurement; Virtual colonoscopy; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting, 2006
  • Conference_Location
    Maastricht
  • ISSN
    1088-9299
  • Print_ISBN
    1-4244-0458-4
  • Electronic_ISBN
    1088-9299
  • Type

    conf

  • DOI
    10.1109/BIPOL.2006.311120
  • Filename
    4100255
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3499585