Title :
Simultaneous Extraction of Collector and Substrate Series Resistance by Simple DC Measurement
Author :
Chen, Tianbing ; Krakowski, Tracey L. ; Strachan, Andy ; Liu, Yun ; Sadovnikov, Alexei ; Babcock, Jeff
Author_Institution :
Nat. Semicond. Corp., Santa Clara, CA
Abstract :
A new forced emitter current method is proposed for the simultaneous measurement of collector and substrate series resistance in bipolar transistors. Compared with conventional series resistance extraction method, this new method does not need any prior knowledge of certain device parameters, or any pre-selected bias condition. It can be used for any bulk bipolar technology
Keywords :
bipolar transistors; electric resistance measurement; semiconductor device measurement; DC measurement; bipolar technology; bipolar transistors; collector series resistance measurement; forced emitter current method; series resistance extraction method; substrate series resistance measurement; Bipolar transistors; Contact resistance; Current measurement; Electrical resistance measurement; Equivalent circuits; Force measurement; P-n junctions; Substrates; Virtual colonoscopy; Voltage;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2006
Conference_Location :
Maastricht
Print_ISBN :
1-4244-0458-4
Electronic_ISBN :
1088-9299
DOI :
10.1109/BIPOL.2006.311121
