• DocumentCode
    3499635
  • Title

    An Accurate and Compact Rayleigh and Rician Fading Channel Simulator

  • Author

    Alimohammad, Amirhossein ; Fard, Saeed Fouladi ; Cockburn, Bruce F. ; Schlegel, Christian

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, AB
  • fYear
    2008
  • fDate
    11-14 May 2008
  • Firstpage
    409
  • Lastpage
    413
  • Abstract
    A stochastic sum-of-sinusoids based simulation model is proposed for Rayleigh and Rician fading channels. The time-averaged statistical properties of the new model have been significantly improved compared to existing models. Verification of the proposed fading simulator is carried out by comparing its measured statistical properties with the properties of the ideal reference models. The simulator utilizes a time-overlapped implementation strategy to provide a compact design suitable for multiple antenna simulators. An implementation of the resulting Rician fading simulator on a Xilinx Virtex-II Pro XC2VP100- 6 FPGA uses only 2% of the configurable slices, 1% of the dedicated multipliers, and 2% of the on-chip block memories while generating 201 million 2 times 16-bit complex-valued fading samples per second. The scalable design of the fading channel simulator enables a straightforward implementation of multiple antenna channels and different diversity schemes.
  • Keywords
    Rayleigh channels; Rician channels; antenna arrays; field programmable gate arrays; statistical analysis; stochastic processes; Rayleigh/Rician fading channel simulator; field programmable gate arrays; multiple antenna simulator; stochastic sum-of-sinusoid based simulation model; time-averaged statistical property; time-overlapped implementation strategy; Antenna measurements; Computational modeling; Computer simulation; Fading; Field programmable gate arrays; Frequency; MIMO; Rayleigh channels; Rician channels; Stochastic processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference, 2008. VTC Spring 2008. IEEE
  • Conference_Location
    Singapore
  • ISSN
    1550-2252
  • Print_ISBN
    978-1-4244-1644-8
  • Electronic_ISBN
    1550-2252
  • Type

    conf

  • DOI
    10.1109/VETECS.2008.97
  • Filename
    4525653