Title :
Integrated BiCMOS 10 GHz S-Parameter Module
Author :
Yoon, Jangsup ; Fox, Robert M. ; Eisenstadt, William R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL
Abstract :
The paper presents integrated BiCMOS 10 GHz s-parameter measurement circuits for performing RF/microwave signal gain and phase detection. Potential applications include embedded IC test and production IC test
Keywords :
BiCMOS integrated circuits; S-parameters; microwave integrated circuits; phase detectors; 10 GHz; BiCMOS process; RF/microwave signal gain; phase detection; s-parameter measurement circuits; s-parameter module; Application specific integrated circuits; BiCMOS integrated circuits; Circuit testing; Gain measurement; Integrated circuit measurements; Integrated circuit testing; Microwave measurements; Performance evaluation; Phase measurement; Scattering parameters; Automatic Test Equipment; Silicon bipolar/BiCMOS process technology; System-on-chip;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2006
Conference_Location :
Maastricht
Print_ISBN :
1-4244-0458-4
Electronic_ISBN :
1088-9299
DOI :
10.1109/BIPOL.2006.311127
