Yield models in a design for manufacturability environment: a bibliography

The bibliography has been compiled for the convenience and use of those in the semiconductor manufacturing area interested in yield modeling. Volumes have been written on the use of models to predict yield of VLSI circuits. The papers that comprise this bibliography address the topical area of yield models/evaluation and have been broken out into five area: yield models, critical area, defect density, layout/tools and books and review articles.