DocumentCode :
3499914
Title :
Surface flashover threshold and switched fields of photoconductive semiconductor switches
Author :
Loubriel, G.M. ; O´Malley, M.W. ; Zutavern, F.J. ; McKenzie, B.B. ; Conley, W.R.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
1988
fDate :
16-20 Oct 1988
Firstpage :
430
Lastpage :
441
Abstract :
It is shown that Si photoconductive semiconductor switches can be used to switch high voltages (up to 123 kV), high fields (up to 82 kV/cm) and high currents (2.8 kA). The ability of the samples to withstand this type of high-voltage, high-current switching depends on the way in which the current penetrates the semiconductor. The appropriate use of water or contacts greatly improves the switching capability. It is also shown that the wafers can support large currents (4.0 kA for GaAs and 2.8 kA for Si) and large linear current densities (3.2 kA/cm for GaAs and 1.4 kA/cm for Si). For GaAs this linear current density corresponds to about 1 MA/cm2 given a penetration depth of about 10-3 cm
Keywords :
III-V semiconductors; elemental semiconductors; flashover; gallium arsenide; photoconducting devices; semiconductor switches; silicon; 123 kV; 2.8 kA; 4.0 kA; GaAs; HV; Si; high-current switching; linear current density; photoconductive semiconductor switches; surface flashover threshold; switched fields; Circuit testing; Electric breakdown; Flashover; Gallium arsenide; Photoconducting devices; Power lasers; Power semiconductor switches; Surface emitting lasers; Surface resistance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1988. Annual Report., Conference on
Conference_Location :
Ottawa, Ont.
Type :
conf
DOI :
10.1109/CEIDP.1988.26369
Filename :
26369
Link To Document :
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