• DocumentCode
    3499914
  • Title

    Surface flashover threshold and switched fields of photoconductive semiconductor switches

  • Author

    Loubriel, G.M. ; O´Malley, M.W. ; Zutavern, F.J. ; McKenzie, B.B. ; Conley, W.R.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    1988
  • fDate
    16-20 Oct 1988
  • Firstpage
    430
  • Lastpage
    441
  • Abstract
    It is shown that Si photoconductive semiconductor switches can be used to switch high voltages (up to 123 kV), high fields (up to 82 kV/cm) and high currents (2.8 kA). The ability of the samples to withstand this type of high-voltage, high-current switching depends on the way in which the current penetrates the semiconductor. The appropriate use of water or contacts greatly improves the switching capability. It is also shown that the wafers can support large currents (4.0 kA for GaAs and 2.8 kA for Si) and large linear current densities (3.2 kA/cm for GaAs and 1.4 kA/cm for Si). For GaAs this linear current density corresponds to about 1 MA/cm2 given a penetration depth of about 10-3 cm
  • Keywords
    III-V semiconductors; elemental semiconductors; flashover; gallium arsenide; photoconducting devices; semiconductor switches; silicon; 123 kV; 2.8 kA; 4.0 kA; GaAs; HV; Si; high-current switching; linear current density; photoconductive semiconductor switches; surface flashover threshold; switched fields; Circuit testing; Electric breakdown; Flashover; Gallium arsenide; Photoconducting devices; Power lasers; Power semiconductor switches; Surface emitting lasers; Surface resistance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1988. Annual Report., Conference on
  • Conference_Location
    Ottawa, Ont.
  • Type

    conf

  • DOI
    10.1109/CEIDP.1988.26369
  • Filename
    26369