DocumentCode
3499914
Title
Surface flashover threshold and switched fields of photoconductive semiconductor switches
Author
Loubriel, G.M. ; O´Malley, M.W. ; Zutavern, F.J. ; McKenzie, B.B. ; Conley, W.R.
Author_Institution
Sandia Nat. Labs., Albuquerque, NM, USA
fYear
1988
fDate
16-20 Oct 1988
Firstpage
430
Lastpage
441
Abstract
It is shown that Si photoconductive semiconductor switches can be used to switch high voltages (up to 123 kV), high fields (up to 82 kV/cm) and high currents (2.8 kA). The ability of the samples to withstand this type of high-voltage, high-current switching depends on the way in which the current penetrates the semiconductor. The appropriate use of water or contacts greatly improves the switching capability. It is also shown that the wafers can support large currents (4.0 kA for GaAs and 2.8 kA for Si) and large linear current densities (3.2 kA/cm for GaAs and 1.4 kA/cm for Si). For GaAs this linear current density corresponds to about 1 MA/cm2 given a penetration depth of about 10-3 cm
Keywords
III-V semiconductors; elemental semiconductors; flashover; gallium arsenide; photoconducting devices; semiconductor switches; silicon; 123 kV; 2.8 kA; 4.0 kA; GaAs; HV; Si; high-current switching; linear current density; photoconductive semiconductor switches; surface flashover threshold; switched fields; Circuit testing; Electric breakdown; Flashover; Gallium arsenide; Photoconducting devices; Power lasers; Power semiconductor switches; Surface emitting lasers; Surface resistance; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1988. Annual Report., Conference on
Conference_Location
Ottawa, Ont.
Type
conf
DOI
10.1109/CEIDP.1988.26369
Filename
26369
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