DocumentCode
3499920
Title
A quantitative method for evaluating the quality of analog layout
Author
Wu, P.B. ; Mack, R.J. ; Massara, AndR E.
Author_Institution
Dept. of Electron. Syst. Eng., Essex Univ., Colchester, UK
Volume
3
fYear
2000
fDate
2000
Firstpage
1140
Abstract
A quantitative benchmarking metric is presented for the objective evaluation of the quality of analog layout. It facilitates comparisons between alternative design automation tools, and, for a given tool, provides the assessment of each layout instance. The quality metric reflects two principal concerns in layout design: area efficiency and net-routing optimality. The results demonstrate the effectiveness of the metric in that the calculated scores provide a characterization that corresponds to expert designers´ judgements
Keywords
analogue integrated circuits; circuit layout CAD; integrated circuit layout; network routing; analog layout quality evaluation; area efficiency; design automation tools comparison; layout design; net-routing optimality; quality metric; quantitative benchmarking metric; Costs; Design automation; Fabrication; Integrated circuit interconnections; Mobile communication; Performance evaluation; Predictive models; Q measurement; Routing; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2000. Proceedings of the 43rd IEEE Midwest Symposium on
Conference_Location
Lansing, MI
Print_ISBN
0-7803-6475-9
Type
conf
DOI
10.1109/MWSCAS.2000.951416
Filename
951416
Link To Document