Title :
A quantitative method for evaluating the quality of analog layout
Author :
Wu, P.B. ; Mack, R.J. ; Massara, AndR E.
Author_Institution :
Dept. of Electron. Syst. Eng., Essex Univ., Colchester, UK
Abstract :
A quantitative benchmarking metric is presented for the objective evaluation of the quality of analog layout. It facilitates comparisons between alternative design automation tools, and, for a given tool, provides the assessment of each layout instance. The quality metric reflects two principal concerns in layout design: area efficiency and net-routing optimality. The results demonstrate the effectiveness of the metric in that the calculated scores provide a characterization that corresponds to expert designers´ judgements
Keywords :
analogue integrated circuits; circuit layout CAD; integrated circuit layout; network routing; analog layout quality evaluation; area efficiency; design automation tools comparison; layout design; net-routing optimality; quality metric; quantitative benchmarking metric; Costs; Design automation; Fabrication; Integrated circuit interconnections; Mobile communication; Performance evaluation; Predictive models; Q measurement; Routing; Systems engineering and theory;
Conference_Titel :
Circuits and Systems, 2000. Proceedings of the 43rd IEEE Midwest Symposium on
Conference_Location :
Lansing, MI
Print_ISBN :
0-7803-6475-9
DOI :
10.1109/MWSCAS.2000.951416
