Title :
Fast interconnect parasitic extraction in deep submicron using bin-based algorithm
Author :
Ferreira, Fabio ; Reis, Ricardo ; Moraes, Fernando
Author_Institution :
Instituto de Informatica, Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
Abstract :
Presents a fast interconnect capacitance extraction tool (wire extractor) LASCA, which considers the lateral coupling, ground and crossover capacitances. Using the bin-based algorithm to extract connectivity, empirical formulation and a simple 2½D methodology, we provide a good trade-off between accuracy and efficiency when compared to traditional layout extraction. Comparisons between our wire extractor with the Diva extractor (Cadence design Systems), give an average difference of only 5% in the final delay of some benchmarks, being up to 30 times faster than Diva
Keywords :
VLSI; capacitance; circuit layout CAD; integrated circuit interconnections; integrated circuit layout; LASCA; benchmarks; bin-based algorithm; capacitance extraction tool; crossover capacitances; deep submicron integrated circuits; efficiency; ground capacitances; interconnect parasitic extraction; lateral coupling; wire extractor; Data mining; Data structures; Delay effects; Design methodology; Feeds; Integrated circuit interconnections; Integrated circuit technology; Libraries; Parasitic capacitance; Wire;
Conference_Titel :
Circuits and Systems, 2000. Proceedings of the 43rd IEEE Midwest Symposium on
Conference_Location :
Lansing, MI
Print_ISBN :
0-7803-6475-9
DOI :
10.1109/MWSCAS.2000.951418