DocumentCode
350006
Title
Validating rule-based systems: a complete methodology
Author
Knauf, Rainer ; Gonzalez, Avelino J. ; Jantke, Klaus P.
Author_Institution
Tech. Hochschule Ilmenau, Germany
Volume
5
fYear
1999
fDate
1999
Firstpage
744
Abstract
This paper describes a complete methodology for the validation of rule-based expert systems. The methodology is presented as a 5-step process that has three central themes: creation of a minimal set of test inputs that adequately cover the domain represented in the knowledge base; a Turing test-like methodology that evaluates the system´s responses to the test inputs and compares them to the responses of human experts; and use of the validation results for system improvement. The development of a minimal set of test inputs takes into consideration various criteria, both user-defined and domain-specific. These criteria are used to reduce the potentially very large exhaustive set of test inputs to one that is practical. The Turing test-like evaluation methodology makes use of a panel of experts to both evaluate each set of test cases and compare the results with those of the expert system, as well as with those of the other experts in the validation panel. The hypothesis being presented is that much can be learned about the experts themselves by having them evaluate each other´s responses to the same test inputs anonymously. Thus, by carefully scrutinizing the results of each expert in relation to the other experts, we are better able to judge an evaluator´s expertise, and consequently, better determine the validity of an expert system
Keywords
expert systems; knowledge verification; Turing test; expert systems verification; rule-based systems validation; system improvement; test inputs; Artificial intelligence; Automation; Buildings; Computer science; Error correction; Expert systems; Heart; Humans; Knowledge based systems; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man, and Cybernetics, 1999. IEEE SMC '99 Conference Proceedings. 1999 IEEE International Conference on
Conference_Location
Tokyo
ISSN
1062-922X
Print_ISBN
0-7803-5731-0
Type
conf
DOI
10.1109/ICSMC.1999.815644
Filename
815644
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