DocumentCode :
3500085
Title :
Fast simulation of hybrid CMOS and STT-MTJ circuits with identified internal state variables
Author :
Shang, Yang ; Fei, Wei ; Yu, Hao
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2012
fDate :
Jan. 30 2012-Feb. 2 2012
Firstpage :
529
Lastpage :
534
Abstract :
Hybrid integration of CMOS and non-volatile memory (NVM) devices has become the technology foundation for emerging non-volatile memory based computing. The primary challenge to validate a hybrid system with both CMOS and non-volatile devices is to develop a SPICE-like simulator that can simulate the dynamic behavior of hybrid system accurately and efficiently. Since spin-transfer-toque magnetic-tunneling-junction (STT-MTJ) device is one of the most promising candidates of next generation NVM devices, it is under great interest in including this new device in the standard CMOS design flow. The previous approaches require complex equivalent circuits to represent the STT-MTJ device, and ignore dynamic effect without consideration of internal states. This paper proposes a new modified nodal analysis for STT-MTJ device with identified internal state variables. As demonstrated by a number of experiment examples on hybrid systems with both CMOS and STT-MTJ devices, our newly developed SPICE-like simulator can deal with the dynamic behavior of STT-MTJ device under arbitrary driving condition and reduce the CPU time by more than 20 times for memory circuits when compared to the previous equivalent circuit approaches.
Keywords :
CMOS memory circuits; equivalent circuits; integrated circuit design; magnetic tunnelling; random-access storage; CPU time reduction; SPICE-like simulator; STT-MTJ device; arbitrary driving condition; dynamic behavior simulation; equivalent circuit approach; hybrid CMOS-STT-MTJ circuits; identified internal-state variables; memory circuits; modified nodal analysis; next-generation NVM devices; nonvolatile memory devices; nonvolatile memory-based computing; spin-transfer-toque magnetic-tunneling-junction device; standard CMOS design flow; CMOS integrated circuits; Equations; Equivalent circuits; Integrated circuit modeling; Magnetization; Mathematical model; Nonvolatile memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific
Conference_Location :
Sydney, NSW
ISSN :
2153-6961
Print_ISBN :
978-1-4673-0770-3
Type :
conf
DOI :
10.1109/ASPDAC.2012.6165009
Filename :
6165009
Link To Document :
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