DocumentCode
3500171
Title
A state-of-the-art automation system of an ASIC wafer fab in Japan
Author
Matsuyama, Akira ; Niou, Jessi
Author_Institution
Nihon Semicond. Inc., Ibaraki, Japan
fYear
1993
fDate
1993
Firstpage
42
Lastpage
47
Abstract
In the implementation of computer integrated manufacturing (CIM), there are varying degrees of integration. Within the semiconductor wafer manufacturing industry, only a few companies have installed a comprehensive and fully automated CIM system in their facilities. Thus, compared to other industries, wafer fabs continue to require significant numbers of production personnel. This makes work-in-process (WIP) control and yield problems more complex and difficult. This paper describes the key points of a state-of-the-art automation system, called FABCON, that was developed and is being implemented in an ASIC wafer fabrication facility (fab) in Japan. This system was created through the collaboration of both Japanese and American companies. Along with the traditional CIM functions of automatic lot tracking, recipe setting, and process data collection, this system also creates the production schedule automatically, and controls the transport of almost all wafer carriers throughout the fab by robots. Specifically, this paper discusses a distributed fab control system based on ISA standard 386 and 486 based PC´s, a dynamic shop floor scheduler/dispatcher, wafer carrier transportation robotics, feedback/feedforward process control, and standardization of equipment interfaces. In addition, this paper describes some of the experiences in the course of development and implementation of the system.
Keywords
application specific integrated circuits; computer integrated manufacturing; industrial robots; integrated circuit manufacture; process computer control; production control; ASIC wafer fab; CIM system; FABCON; Japan; WIP control; automatic lot tracking; computer integrated manufacturing; dynamic shop floor scheduler/dispatcher; equipment interfaces; feedback/feedforward process control; process data collection; production schedule; recipe setting; robots; semiconductor wafer manufacturing industry; wafer carriers; Application specific integrated circuits; Automatic control; Computer integrated manufacturing; Control systems; Electrical equipment industry; Job shop scheduling; Manufacturing automation; Manufacturing industries; Production; Robotics and automation;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing Science Symposium, 1993. ISMSS 1993., IEEE/SEMI International
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-1212-0
Type
conf
DOI
10.1109/ISMSS.1993.263702
Filename
263702
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