Title :
Metal/silicon dioxide microtube improves optical and electrical properties of neuroprobe
Author :
Nakamura, T. ; Sakata, Masayoshi ; Goryu, Akihiro ; Ishida, Makoto ; Kawano, T.
Author_Institution :
Dept. of Electr. & Electron. Inf. Eng., Toyohashi Univ. of Technol., Toyohashi, Japan
Abstract :
Here we report vertical metal/silicon dioxide (SiO2) multiwalled microtube arrays as electrical and optical neuroprobes for “optogenetic”. Three-dimensional metal/SiO2-microtube arrays can be fabricated by vapor-liquid-solid (VLS) growth of silicon-wire, followed by the SiO2/metal depositions and the core-silicon etching. As the inside metal, we use iridium (Ir) with a low electrical electrolyte/electrode interfacial impedance in saline. An optical propagation through the Ir/SiO2-tube calculated by finite-difference time-domain (FDTD) method clearly indicates the effect of the inside Ir on the improved locality of light stimuli with the spot diameter of <; 3 μm. These results suggest that the Ir/SiO2-microtube array provides the low-impedance electrode and local optical stimuli with a same alignment, promising a new class of multifunctional neuroprobes for optogenetic.
Keywords :
bio-optics; bioMEMS; bioelectric phenomena; biomedical electrodes; electrolytes; etching; finite difference time-domain analysis; genetics; iridium; liquid phase deposition; microelectrodes; microfabrication; neurophysiology; silicon compounds; FDTD; Ir-SiO2; core-silicon etching; electrical electrolyte-electrode interfacial impedance; electrical properties; finite-difference time-domain method; light stimuli; local optical stimuli; low-impedance electrode; multifunctional neuroprobes; optical propagation; optical properties; optogenetics; saline; spot diameter; three-dimensional metal-silicon dioxide-microtube arrays; vapor-liquid-solid growth; vertical metal-silicon dioxide multiwalled microtube arrays; Electron tubes; Impedance; Metals; Optical device fabrication; Optical propagation; Optical recording; Stimulated emission;
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2013 IEEE 26th International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4673-5654-1
DOI :
10.1109/MEMSYS.2013.6474441