DocumentCode :
3500268
Title :
A prospectus for gigascale integration (GSI)
Author :
Meindl, James D.
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
fYear :
1993
fDate :
1993
Firstpage :
39
Lastpage :
41
Abstract :
Prospects for gigascale integration (GSI) are governed by a hierarchy of limits whose levels are fundamental, material, device, circuit and system. Theoretical limits are elucidate in the power versus delay (Ptd) plane for switching operations and in the square of the reciprocal length versus delay (L-2t) plane for transmission operations. The totality of practical limits is captured by three macrovariables; minimum feature size, chip area and number of transistors per minimum feature area. The singular metric which reveals the efficacy of a technology for GSI is the chip performance index (CPI) defined as the number of transistors per chip divided by the power-delay product of the technology. The CPI has increased by about 1012 since 1960 and is projected to increase still further by 106 by 2020.
Keywords :
VLSI; digital integrated circuits; integrated circuit technology; GSI; chip area; chip performance index; gigascale integration; minimum feature size; power versus delay plane; reciprocal length versus delay plane; switching operations; transmission operations; Circuits and systems; Composite materials; Delay; Electrons; Energy consumption; Integrated circuit interconnections; Logic devices; Performance analysis; Power system interconnection; Quantum mechanics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing Science Symposium, 1993. ISMSS 1993., IEEE/SEMI International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-1212-0
Type :
conf
DOI :
10.1109/ISMSS.1993.263706
Filename :
263706
Link To Document :
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