Title :
Reflection Properties Of Isotropic-Pseudochiral Interfaces
Author :
Toscano, Alessandro ; Vaccari, M. ; Vegni, L.
Author_Institution :
Universita di Roma "La Sapienza"
Keywords :
Admittance; Anisotropic magnetoresistance; Boundary conditions; Conducting materials; Electromagnetic fields; Electromagnetic propagation; Electromagnetic reflection; Frequency; Microstructure; Optical reflection;
Conference_Titel :
Microwave Conference/Brazil, 1993., SBMO International
Print_ISBN :
0-7803-1288-0
DOI :
10.1109/SBMO.1993.587218