DocumentCode :
35005
Title :
A System-Level Electrostatic-Discharge-Protection Modeling Methodology for Time-Domain Analysis
Author :
Monnereau, Nicolas ; Caignet, Fabrice ; Tremouilles, David ; Nolhier, Nicolas ; Bafleur, Marise
Author_Institution :
Lab. of Anal. of Syst. Archit., Centre Nat. de la Rech. Sci., Toulouse, France
Volume :
55
Issue :
1
fYear :
2013
fDate :
Feb. 2013
Firstpage :
45
Lastpage :
57
Abstract :
A system level modeling methodology is presented and validated on a simple case. It allows precise simulations of electrostatic discharge (ESD) stress propagation on a printed circuit board (PCB). The proposed model includes the integrated circuit (IC) ESD protection network, IC package, PCB lines, passives components, and externals elements. The impact of an external component on the ESD propagation paths into an IC is demonstrated. Resulting current and voltage waveforms are analyzed to highlight the interactions between all the elements of an operating PCB. A precise measurement technique was designed and used to compare with the simulation results. The model proposed in this paper is able to predict, with good accuracy, the propagation of currents and voltages into the whole system during ESD stress. It might be used to understand why failures occur and how to fix them with the most suitable solution.
Keywords :
electrostatic discharge; integrated circuit modelling; printed circuits; time-domain analysis; ESD propagation; ESD stress propagation; IC ESD protection network; IC package; PCB lines; current waveforms; electrostatic discharge stress propagation; external component; integrated circuit ESD protection network; passives components; precise measurement technique; printed circuit board lines; system-level electrostatic-discharge-protection modeling methodology; time-domain analysis; voltage waveforms; Current measurement; Electrostatic discharges; Integrated circuit modeling; Mathematical model; Standards; Transmission line measurements; Electromagnetic compatibility (EMC); electrostatic discharge (ESD); modeling; system level; time-domain simulation;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2012.2208973
Filename :
6280661
Link To Document :
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