• DocumentCode
    3500603
  • Title

    LFSR Polynomial and Seed Selection Using Genetic Algorithm

  • Author

    Aleksejev, E. ; Jutman, A. ; Ubar, R.

  • Author_Institution
    Dept. of Comput. Eng., Tallinn Univ. of Technol.
  • fYear
    2006
  • fDate
    2-4 Oct. 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper the authors present a framework aimed at optimization of important properties of pseudo-random test pattern generators used in embedded testing of modern complex digital devices like systems-on-chip. The method we propose is based on an evolutionary technique often referred as the genetic algorithm. Experimental results show the feasibility of the proposed method
  • Keywords
    automatic test pattern generation; genetic algorithms; shift registers; system-on-chip; genetic algorithm; linear feedback shift registers; pseudorandom test pattern generators; seed selection; system-on-chip; Built-in self-test; Circuit testing; Clocks; Embedded computing; Feedback loop; Genetic algorithms; Genetic engineering; Polynomials; System testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Baltic Electronics Conference, 2006 International
  • Conference_Location
    Tallinn
  • ISSN
    1736-3705
  • Print_ISBN
    1-4244-0414-2
  • Electronic_ISBN
    1736-3705
  • Type

    conf

  • DOI
    10.1109/BEC.2006.311092
  • Filename
    4100313
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3500603