Automated XML-based Test Modelling For Mixed-Signal Circuits

Author

Mellik, A.

Author_Institution

Dept. of Electron., ITU, Tallinn

fYear

2006

fDate

2-4 Oct. 2006

Firstpage

1

Lastpage

2

Abstract

Automated system-level test model approach is introduced, incorporating XML, while making use of interchangeable virtual instruments (IVI) and automatic test markup language (ATML) standards. Integrating basic block models into an automated test framework, targeting specifically mixed-signal ICs, the focus is on abstraction through integrating proven technologies in growing complexity levels. Initial result shows high potential for parallel development of system-level design and test models, thus reducing total production time

Keywords

XML; automatic test software; integrated circuit testing; mixed analogue-digital integrated circuits; virtual instrumentation; ATML standards; XML; automated test modeling; automatic test markup language; interchangeable virtual instruments; mixed-signal integrated circuits; production time reduction; system-level design; Automatic testing; Circuit testing; Electronic equipment testing; Instruments; Markup languages; Semiconductor device testing; Software testing; System testing; System-level design; XML;

fLanguage

English

Publisher

ieee

Conference_Titel

Baltic Electronics Conference, 2006 International

Conference_Location

Tallinn

ISSN

1736-3705

Print_ISBN

1-4244-0414-2

Electronic_ISBN

1736-3705

Type

conf

DOI

10.1109/BEC.2006.311098

Filename

4100319