• DocumentCode
    3500774
  • Title

    Constructing current-based gate models based on existing timing library

  • Author

    Kahng, Andrew B. ; Liu, Bao ; Xu, Xu

  • Author_Institution
    Dept. of Comput. Sci. & Eng., California Univ. at San Diego, La Jolla, CA
  • fYear
    2006
  • fDate
    27-29 March 2006
  • Lastpage
    42
  • Abstract
    Current-based gate modeling achieves a new level of accuracy in nanoscale design timing and signal integrity analysis. However, to generate current-based gate models requires additional pre-characterization of the gate, e.g., in the form of a new or an extended timing library format. We construct current-based gate models based on the existing Liberty timing library format without further pre-characterization. We present an inverse problem formulation, and propose to solve the problem by quadratic polynomial regression. Our constructed current-based gate models find applications in timing, power, and signal integrity verifications for improved accuracy in library-compatible flows, e.g., to include power supply voltage drop effect in gate delay calculation without further pre-characterization, to calculate gate supply current, etc. Our experimental results show our constructed current-based gate models achieve slightly less accurate results, e.g., within 4.6%(8.6%), than pre-characterized current-based gate models, e.g., within 4.3%(4.4%), of SPICE results in gate delay calculation for ideal (degraded) power supply voltage, and accurate gate supply current calculation
  • Keywords
    integrated circuit design; integrated circuit modelling; inverse problems; polynomials; regression analysis; Liberty; current-based gate models; extended timing library format; inverse problem formulation; nanoscale design timing analysis; quadratic polynomial regression; signal integrity analysis; Current supplies; Delay effects; Inverse problems; Libraries; Polynomials; Power supplies; Signal analysis; Signal design; Timing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2523-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2006.39
  • Filename
    1613111