Title : 
Simulation and modeling of wafer level silicon-base spiral inductor
         
        
            Author : 
Xinhai Bian ; Hongyan Guo ; Li Zhang ; Tan, K.H. ; Lai, C.M.
         
        
            Author_Institution : 
Jiangyin Changdian Adv. Packaging Co., Ltd., Jiangyin, China
         
        
        
        
        
        
            Abstract : 
With the development of radio frequency wireless communication technology, there are strong demands of spiral inductor with high performance and low profile. The inductor is a basic component of IPD (Integrated Passive Devices [1]) including oscillators, filters, mixers and baluns. In this paper, the structure and process of fabricating a high performance wafer level silicon-base spiral inductor was presented and the effects of geometrical parameters on the inductance and quality factor were studied via a commercial 3-D EM [2] (Electromagnetic) simulator software. The performance was compared with the traditional on-chip embedded inductors. The results show that the number of turns and inner radius significantly impact the inductance and the performance of the mentioned spiral inductor is better than the traditional on-chip embedded inductors.
         
        
            Keywords : 
Q-factor; elemental semiconductors; inductors; silicon; wafer level packaging; 3D EM software; IPD; Si; baluns; electromagnetic simulator software; filters; integrated passive devices; mixers; on-chip embedded inductors; oscillators; quality factor; radiofrequency wireless communication technology; wafer level silicon-base spiral inductor modelling; Coils; Inductors; Integrated circuit modeling; Metals; Q factor; Spirals; Substrates; EM; IPD; Q-factor; RDL; silicon-base; spiral inductor;
         
        
        
        
            Conference_Titel : 
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
         
        
            Conference_Location : 
Guilin
         
        
            Print_ISBN : 
978-1-4673-1682-8
         
        
            Electronic_ISBN : 
978-1-4673-1680-4
         
        
        
            DOI : 
10.1109/ICEPT-HDP.2012.6474561