DocumentCode :
3501144
Title :
System-level SRAM yield enhancement
Author :
Kurdahi, Fadi J. ; Eltawil, Ahmed M. ; Park, Young-Hwan ; Kanj, Rouwaida N. ; Nassif, Sani R.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Irvine, CA
fYear :
2006
fDate :
27-29 March 2006
Lastpage :
184
Abstract :
It is well known that SRAM constitutes a large portion of modern integrated circuits, with 80% or more of the total transistors being dedicated to SRAM in a typical processor or SOC. Thus yield management of these SRAMs plays a crucial role in insuring design success. This paper demonstrates analysis techniques to model and improve the yield of SRAMs at the system level by proper accounting for the coupling between the algorithms targeted for an SOC and the performance, power, and yield of SRAMs used in implementing the algorithms. It is shown that coupling the algorithm and SRAM design phases provides significant advantages over independent optimization
Keywords :
SRAM chips; integrated circuit design; integrated circuit yield; logic design; system-on-chip; SRAM yield enhancement; modern integrated circuits; system-on-chip; yield management; Algorithm design and analysis; Coupling circuits; Fluctuations; Geometry; Integrated circuit yield; Manufacturing; Random access memory; Resource description framework; Threshold voltage; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2523-7
Type :
conf
DOI :
10.1109/ISQED.2006.130
Filename :
1613133
Link To Document :
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