DocumentCode :
3501192
Title :
Growth and shear strength of intermetallic compounds in Sn-Ag-Cu solder joints
Author :
Jiandong Zhu ; Chunqing Wang ; Chunjin Hang ; Yanhong Tian
Author_Institution :
State Key Lab. of Adv. Welding & Joining, Harbin Inst. of Technol., Harbin, China
fYear :
2012
fDate :
13-16 Aug. 2012
Firstpage :
40
Lastpage :
43
Abstract :
The growth evolution of intermetallic compounds and shear properties of various Sn-Ag-Cu solder joints were investigated by thermal cycling test. The numbers of thermal cycling tests were 0, 200, 400, 600, 800 cycles. Polyhedron particles composited of (Cu1-xNix)6Sn5 were observed after 400 thermal cycles and found in bulk solder away from the IMC layers after much more thermal cycles. Meanwhile, cracks are observed in the interfacial IMC layers after thermal cycling experiment. The shear strength of solder joints decreased with increasing the cycles of thermal cycling test.
Keywords :
copper alloys; silver alloys; solders; tin alloys; Sn-Ag-Cu; interfacial IMC layers; intermetallic compound growth evolution; intermetallic compound shear strength; polyhedron particles; solder joints; thermal cycling test; Compounds; Electric shock; Intermetallic; Joints; Lead; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4673-1682-8
Electronic_ISBN :
978-1-4673-1680-4
Type :
conf
DOI :
10.1109/ICEPT-HDP.2012.6474564
Filename :
6474564
Link To Document :
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