DocumentCode :
3501433
Title :
Enhancement of signal integrity and power integrity with embedded capacitors in high-speed packages
Author :
Srinivasan, K. ; Muthana, P. ; Mandrekar, R. ; Engin, E. ; Choi, J. ; Swaminathan, M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
fYear :
2006
fDate :
27-29 March 2006
Lastpage :
291
Abstract :
Improvements in electrical performance of microelectronic systems can be achieved by the integration of passive elements such as capacitors, resistors and inductors. The advantage of embedded passives is their low parasitic values. In this paper, enhancement of signal-integrity and power-integrity is investigated when a high-k planar capacitor is used as a power-ground plane, with embedded high-k discrete capacitors that have low ESI and ESR values as decoupling capacitors for SSN suppression. In order to capture the effects of embedded capacitor performance, a test-structure involving many signal-lines referenced to a power-ground plane was simulated. Simulation results show that the high-k planar capacitor reduces coupling of noise currents through the power-ground planes and helps improve the eye-opening. Simulation results have been quantified for a case, where a fewer number of embedded discrete capacitors helps reduce SSN more significantly than surface-mounts. Transient co-simulation of the signal delivery network (SDN) and the power-delivery network (PDN) are performed using Y-parameters
Keywords :
capacitors; dielectric materials; integrated circuit design; integrated circuit packaging; SSN suppression; Y-parameters; decoupling capacitors; discrete capacitors; electrical performance; embedded capacitors; embedded passives; high-k planar capacitor; high-speed packages; power integrity; power-delivery network; power-ground plane; signal delivery network; signal integrity; transient co-simulation; Capacitors; High K dielectric materials; High-K gate dielectrics; Inductors; Microelectronics; Noise reduction; Packaging; Paramagnetic resonance; Resistors; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2523-7
Type :
conf
DOI :
10.1109/ISQED.2006.60
Filename :
1613150
Link To Document :
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