Title :
Parametric instability of mobile elastic gate in tera- and nano- high electron mobility transistor
Author :
Semenenko, V.L. ; Leiman, V.G. ; Arsenin, A.V. ; Gladun, A.D. ; Ryzhii, V.I.
Author_Institution :
Moscow Inst. of Phys. & Technol. (State Univ.), Dolgoprudnyi, Russia
Abstract :
Effective excitation of the micro and nanometer-size resonators has number of applications at various fields of science and technology. In particular, they include wireless telecommunication technologies, high sensitivity measuring systems, quantum information processing devices. At the present report we consider the mechanical cantilever oscillations parametric excitation that serves as the gate electrode of a high electron mobility transistor (HEMT). The parametric coupling between the mechanical resonator (cantilever) and the oscillations of two-dimensional electron gas (2DEG) with high electron mobility is considered. In the capacity of the mechanical resonator a clamped nanobeam or a carbon nanotube might be used. 2DEG can arise in GaAs/AlGaAs heterostructures on the basis of which high electron mobility transistors (HEMT) are produced.
Keywords :
cantilevers; carbon nanotubes; high electron mobility transistors; micromechanical resonators; nanoelectronics; stability; two-dimensional electron gas; 2DEG; HEMT; carbon nanotube; clamped nanobeam; gate electrode; heterostructures; high sensitivity measuring systems; mechanical cantilever oscillations parametric excitation; mechanical resonator; microsize resonator; mobile elastic gate; nano-high electron mobility transistor; nanometer-size resonators; parametric coupling; parametric instability; quantum information processing devices; tera-high electron mobility transistor; two-dimensional electron gas; wireless telecommunication technology; Electric potential; Electrodes; HEMTs; Logic gates; MODFETs; Optical resonators; Oscillators;
Conference_Titel :
Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW), 2010 International Kharkov Symposium on
Conference_Location :
Kharkiv
Print_ISBN :
978-1-4244-7900-9
DOI :
10.1109/MSMW.2010.5546137