Title :
On the weak spot concept in the dielectric breakdown of thin polymer films
Author :
Saba, A. ; Laurent, C. ; Segui, Y.
Author_Institution :
Lab. de Genie Electr., Univ. Paul Sabatier, Toulouse, France
Abstract :
Films were prepared in a low-frequency (2.5-kHz) glow discharge diode system from hexamethyldisiloxane vapors at a pressure of 0.25 torr. Ramp and step tests were carried out to obtain voltage breakdown data. Statistical analysis of the weak-spot breakdown data shows that dielectric information can be extracted from their field functional dependence. As a consequence, these data cannot be considered as an extrinsic artefact but rather as a property of the film itself
Keywords :
electric breakdown of solids; insulation testing; organic insulating materials; plasma deposited coatings; polymer films; 0.25 torr; 2.5 kHz; Al-polysiloxane-Al structure; dielectric breakdown; extrinsic artefact; field functional dependence; hexamethyldisiloxane vapors; low frequency glow discharge diode system; ramp testing; statistical analysis; step tests; thin polymer films; voltage breakdown data; weak-spot breakdown data; Artificial intelligence; Breakdown voltage; Dielectric breakdown; Dielectric losses; Impurities; Inductors; Pollution; Polymer films; Resistors; Testing;
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1989., Proceedings of the 3rd International Conference on
Conference_Location :
Trondheim
DOI :
10.1109/ICSD.1989.69164
