DocumentCode :
3501660
Title :
Formic acid with Pt catalyst combined treatment process for Cu low temperature bonding
Author :
Wenhua Yang ; Akaike, Masakate ; Fujino, Masahisa ; Suga, Takashi
Author_Institution :
Dept. of Precision Eng., Univ. of Tokyo, Tokyo, Japan
fYear :
2012
fDate :
13-16 Aug. 2012
Firstpage :
147
Lastpage :
150
Abstract :
In this study, formic acid combined Pt catalyst in situ pretreatment process was developed for low temperature Cu/Cu direct bonding. Cu film surface was treated by formic acid without/with Pt as catalyst at 200°C for 10min to reduce Cu surface oxide. Through XPS analysis, it is found that, with Pt as catalyst, formic acid reduction effect on Cu film surface is better than that of formic acid treatment without Pt as catalyst. Cu film and Cu micro-electrodes was bonded together at 200°C in N2 atmosphere after formic acid treatment without/with Pt catalyst. The bonding strength is evaluated using die shear tester. When sample was treated by formic acid with Pt catalyst, the bonding is stronger compared with the bonding treated by formic acid without Pt catalyst. Bonding strength also increases with keeping the contact load for long time during the bonding. When sample was treatedat200°C for 10min with Pt catalyst, and the contact load as 1000N was kept for 60min during bonding, the bonding strength is about 28.5MPa. Finally, the cross-section image of bonding interface is obtained through SEM observation.
Keywords :
X-ray photoelectron spectra; bonding processes; catalysts; copper; electrical contacts; electronics packaging; low-temperature techniques; metallic thin films; microelectrodes; platinum; scanning electron microscopy; Cu-Pt; SEM observation; XPS analysis; bonding interface; bonding strength; contact load; cross-section image; die shear tester; film surface; formic acid reduction effect; formic acid treatment; low temperature direct bonding; microelectrodes; pressure 28.5 MPa; pretreatment process; surface oxide reduction; temperature 200 degC; time 10 min; time 60 min; Bonding; Electrodes; Films; Packaging; Scanning electron microscopy; Surface treatment; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4673-1682-8
Electronic_ISBN :
978-1-4673-1680-4
Type :
conf
DOI :
10.1109/ICEPT-HDP.2012.6474588
Filename :
6474588
Link To Document :
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