DocumentCode :
3501724
Title :
Design space exploration of RTL datapaths using Rent parameter based stochastic wirelength estimation
Author :
Krishnan, Vyas ; Katkoori, Srinivas
Author_Institution :
Dept. of Comput. Sci. & Eng., South Florida Univ., Tampa, FL
fYear :
2006
fDate :
27-29 March 2006
Lastpage :
369
Abstract :
We present an assessment of a priori stochastic wire-length estimation as a viable technique for evaluating the interconnect requirements of designs explored in RTL datapath synthesis. The model estimates the wirelength requirements of a gate level netlist a priori, based on Rentian parameters extracted dynamically from RTL netlists. Experimental results indicate that the wirelength estimates of our dynamic Rent parameter extraction method are in agreement within an average of 3.96% to those obtained from designs synthesized by a commercial place-and-route tool, while offering an average speedup of 278% over physical synthesis, suggesting that stochastic wirelength estimation methods are a viable approach to guide design space exploration in high-level synthesis
Keywords :
VLSI; high level synthesis; integrated circuit interconnections; integrated circuit layout; parameter estimation; stochastic processes; RTL datapaths; Rent parameter; a priori estimation; design space exploration; high-level synthesis; interconnect requirements; parameter extraction; place-and-route tool; stochastic wirelength estimation; Capacitance; Delay; High level synthesis; Integrated circuit interconnections; Parameter extraction; Power system interconnection; Space exploration; Stochastic processes; Very large scale integration; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2523-7
Type :
conf
DOI :
10.1109/ISQED.2006.48
Filename :
1613164
Link To Document :
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