Title :
On N-detect pattern set optimization
Author_Institution :
Mentor Graphics Corp., Marlborough, MA
Abstract :
In this paper, we illustrate that the traditional N-detect ATPG is unoptimized in terms of the size of the generated pattern set. The optimization problem is formulated as a minimum covering problem. Integer linear programming (ILP) is applied to obtain an N-detection ATPG pattern set with the minimum number of patterns. A heuristic method is also proposed to obtain sub-optimal solutions efficiently. Experimental results demonstrate that by using the proposed method, the number of N-detection patterns can be reduced by about 18% for N=3 and about 13% for N=5 without compromising N-detection objective
Keywords :
automatic test pattern generation; fault diagnosis; integer programming; linear programming; logic testing; N detect pattern set optimization; N-detection ATPG pattern set; integer linear programming; Automatic test pattern generation; Circuit faults; Compaction; Fault detection; Graphics; Integer linear programming; Iterative algorithms; Optimization methods; Testing; Very large scale integration;
Conference_Titel :
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2523-7
DOI :
10.1109/ISQED.2006.94