DocumentCode
3501925
Title
On N-detect pattern set optimization
Author
Huang, Yu
Author_Institution
Mentor Graphics Corp., Marlborough, MA
fYear
2006
fDate
27-29 March 2006
Lastpage
450
Abstract
In this paper, we illustrate that the traditional N-detect ATPG is unoptimized in terms of the size of the generated pattern set. The optimization problem is formulated as a minimum covering problem. Integer linear programming (ILP) is applied to obtain an N-detection ATPG pattern set with the minimum number of patterns. A heuristic method is also proposed to obtain sub-optimal solutions efficiently. Experimental results demonstrate that by using the proposed method, the number of N-detection patterns can be reduced by about 18% for N=3 and about 13% for N=5 without compromising N-detection objective
Keywords
automatic test pattern generation; fault diagnosis; integer programming; linear programming; logic testing; N detect pattern set optimization; N-detection ATPG pattern set; integer linear programming; Automatic test pattern generation; Circuit faults; Compaction; Fault detection; Graphics; Integer linear programming; Iterative algorithms; Optimization methods; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
0-7695-2523-7
Type
conf
DOI
10.1109/ISQED.2006.94
Filename
1613177
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