DocumentCode :
3501941
Title :
Data compression in multiterminal statistical inference —linear-threshold encoding
Author :
Amari, Shun-Ichi
Author_Institution :
RIKEN Brain Sci. Inst., Wako, Japan
fYear :
2011
fDate :
July 31 2011-Aug. 5 2011
Firstpage :
1126
Lastpage :
1130
Abstract :
When correlated letters are generated from two or more information sources at different locations, we need to transmit observed data to a common destination for the purpose of estimating or testing the joint probability distribution of the information sources. When we need to compress data separately at each location, what is the optimal data compression scheme? This is a fundamental problem of multiterminal statistical inference proposed by T. Berger [1] and still remains unsolved. We give a new idea of linear-threshold encoding for data compression, and study the performances of this class of data compression by using a simple binary information sources. In order to estimate or test the correlation of two sources, we show that, when correlation is weak, a simple (trivial) encoding where each encoded bit depends only on one original letter is optimal, that is, the case of no substantial encoding, just discarding overflown letters. As the strength of correlation increases, it is better to use a number of letters to encode each bit, for example, to use the majority of three letters, in the case of transmission rate is 1/3. Further, when the correlation is very strong, it is better to encode each bit by using all the letters, where weighted majority decision plays a fundamental role.
Keywords :
data compression; linear codes; statistical distributions; binary information sources; data compression; linear-threshold encoding scheme; multiterminal statistical inference; optimal data compression scheme; probability distribution; transmission rate; Correlation; Data compression; Encoding; Estimation; Joints; Probability distribution; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Theory Proceedings (ISIT), 2011 IEEE International Symposium on
Conference_Location :
St. Petersburg
ISSN :
2157-8095
Print_ISBN :
978-1-4577-0596-0
Electronic_ISBN :
2157-8095
Type :
conf
DOI :
10.1109/ISIT.2011.6033707
Filename :
6033707
Link To Document :
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