DocumentCode
3501947
Title
An improved method for identifying linear dependencies in path delay faults
Author
Flanigan, E. ; Haniotakis, T. ; Tragoudas, S.
Author_Institution
Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL
fYear
2006
fDate
27-29 March 2006
Lastpage
462
Abstract
The use of linear dependency relationships among path delay faults (PDFs) is an effective way to determine circuit timing characteristics. The proposed approach improves the performance of performing a linear dependency check by accelerating the Gauss elimination process. This paper presents new algorithms to represent a PDF with respect to a testable set as well as a methodology to calculate the delays of all critical sensitizable PDFs while testing only a small subset of testable PDFs. In contrast to a previous implicit method, the proposed method guarantees that each sensitizable fault can be represented as a linear combination of tested faults but its time performance can be significantly improved when combined with such implicit methods
Keywords
Gaussian processes; fault diagnosis; logic testing; timing; Gauss elimination; circuit timing; linear combination; linear dependency relationships; path delay faults; Acceleration; Automatic testing; Circuit faults; Circuit testing; Clocks; Delay effects; Fault diagnosis; Gaussian processes; Propagation delay; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
0-7695-2523-7
Type
conf
DOI
10.1109/ISQED.2006.24
Filename
1613179
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