• DocumentCode
    3501947
  • Title

    An improved method for identifying linear dependencies in path delay faults

  • Author

    Flanigan, E. ; Haniotakis, T. ; Tragoudas, S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL
  • fYear
    2006
  • fDate
    27-29 March 2006
  • Lastpage
    462
  • Abstract
    The use of linear dependency relationships among path delay faults (PDFs) is an effective way to determine circuit timing characteristics. The proposed approach improves the performance of performing a linear dependency check by accelerating the Gauss elimination process. This paper presents new algorithms to represent a PDF with respect to a testable set as well as a methodology to calculate the delays of all critical sensitizable PDFs while testing only a small subset of testable PDFs. In contrast to a previous implicit method, the proposed method guarantees that each sensitizable fault can be represented as a linear combination of tested faults but its time performance can be significantly improved when combined with such implicit methods
  • Keywords
    Gaussian processes; fault diagnosis; logic testing; timing; Gauss elimination; circuit timing; linear combination; linear dependency relationships; path delay faults; Acceleration; Automatic testing; Circuit faults; Circuit testing; Clocks; Delay effects; Fault diagnosis; Gaussian processes; Propagation delay; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2523-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2006.24
  • Filename
    1613179