DocumentCode
3502028
Title
DFM metrics for standard cells
Author
Aitken, Robert
Author_Institution
ARM Phys. IP, Inc., Sunnyvale, CA
fYear
2006
fDate
27-29 March 2006
Lastpage
496
Abstract
Design for manufacturability (DFM) is becoming increasingly important as process geometries shrink. Conventional design rule pass/fail is not adequate to quantify DFM compliance. Instead, metrics are needed to compare designs. Yield might be an ideal metric, but is difficult to calculate objectively without significant manufacturing data. This paper investigates the qualities that good metrics require and shows an example of an approach that seems promising
Keywords
design for manufacture; integrated circuit design; integrated circuit manufacture; design for manufacturability metrics; manufacturing data; standard cells; Design for manufacture; Electronic equipment testing; Foundries; Geometry; Libraries; Manufacturing processes; Process design; Propagation delay; Silicon; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
0-7695-2523-7
Type
conf
DOI
10.1109/ISQED.2006.50
Filename
1613184
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