• DocumentCode
    3502028
  • Title

    DFM metrics for standard cells

  • Author

    Aitken, Robert

  • Author_Institution
    ARM Phys. IP, Inc., Sunnyvale, CA
  • fYear
    2006
  • fDate
    27-29 March 2006
  • Lastpage
    496
  • Abstract
    Design for manufacturability (DFM) is becoming increasingly important as process geometries shrink. Conventional design rule pass/fail is not adequate to quantify DFM compliance. Instead, metrics are needed to compare designs. Yield might be an ideal metric, but is difficult to calculate objectively without significant manufacturing data. This paper investigates the qualities that good metrics require and shows an example of an approach that seems promising
  • Keywords
    design for manufacture; integrated circuit design; integrated circuit manufacture; design for manufacturability metrics; manufacturing data; standard cells; Design for manufacture; Electronic equipment testing; Foundries; Geometry; Libraries; Manufacturing processes; Process design; Propagation delay; Silicon; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2523-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2006.50
  • Filename
    1613184