Title :
Lumped versus distributed RC and RLC interconnect impedances
Author :
Tang, Kevin T. ; Friedman, Eby G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA
Abstract :
A Fourier analysis of on-chip signals in CMOS integrated circuits is presented in this paper. It is demonstrated that on-chip signals can be approximated by a Fourier series up to the 15th harmonic component. The effective load impedance characterizing a distributed RC and RLC line driven by a CMOS logic gate is based on a Fourier analysis of the on-chip signals. The voltage waveform based on the effective load impedance approaches a distributed RC and RLC line approximated by sections of lumped RC and RLC elements
Keywords :
CMOS logic circuits; Fourier analysis; Fourier series; RC circuits; harmonics; integrated circuit interconnections; logic gates; CMOS integrated circuits; CMOS logic gate; Fourier analysis; Fourier series; RC interconnect impedances; RLC interconnect impedances; effective load impedance; effective load impedance characteristics; harmonic component; on-chip signals; CMOS integrated circuits; CMOS logic circuits; Impedance; Integrated circuit interconnections; Integrated circuit technology; Logic gates; RLC circuits; Semiconductor device modeling; Signal analysis; Voltage;
Conference_Titel :
Circuits and Systems, 2000. Proceedings of the 43rd IEEE Midwest Symposium on
Conference_Location :
Lansing, MI
Print_ISBN :
0-7803-6475-9
DOI :
10.1109/MWSCAS.2000.951604
