• DocumentCode
    3502117
  • Title

    Recognizing the Patten of Beta Based on Rough Sets and Support Vector Machine

  • Author

    Zhou, Jianguo ; Tian, Jiming

  • Author_Institution
    Sch. of Bus. & Adm., North China Electr. Power Univ., Baoding
  • fYear
    2007
  • fDate
    21-25 Sept. 2007
  • Firstpage
    3709
  • Lastpage
    3712
  • Abstract
    Beta is calculated by linear analysis between the closing prices of stocks and the security index of stock market. However, many studies have showed there are strong relationships between beta and financial information. Since the traditional statistical techniques have many limitations in disposing deficient and high noisy data, the past studies rested on proving the relationships between financial information and systematic risk. In this study, the hybrid system of rough sets and support vector machine (SVM) was employed to dispose the problem of pattern recognizing, in which rough sets were used for accelerating or simplifying the process of training SVM by eliminating the redundant data from database. Therefore, this paper used the hybrid system to recognize the clusters of beta with financial information. At last the effectiveness of our approach was verified by testing the hybrid system with the companies which listed on Shenzhen stock market.
  • Keywords
    financial data processing; pattern recognition; pricing; rough set theory; statistical analysis; stock markets; support vector machines; Shenzhen stock market; beta information; financial information; linear analysis; pattern recognition; rough sets; security index; statistical techniques; stock markets; stock prices; support vector machine; Acceleration; Data security; Hybrid intelligent systems; Information security; Information systems; Power system security; Rough sets; Stock markets; Support vector machines; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Communications, Networking and Mobile Computing, 2007. WiCom 2007. International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1311-9
  • Type

    conf

  • DOI
    10.1109/WICOM.2007.917
  • Filename
    4340692