Title :
Analysis and experimental results of an FPGA-based strategy for fast production test of high resolution ADCs
Author :
De Venuto, Daniela ; Reyneri, Leonardo
Author_Institution :
Politecnico di Bari
Abstract :
This work describes an intensive investigation on the test strategy known as polynomial fitting that uses FPGA generated stimuli for cheap and fast testing of high resolution ADCs. Simulation and experimental results showed sensitivity on the specifications parameters detection of 90 dB. The proposed method can also help to control the cost of ADC production test, extends the test coverage and enable built-in self-test and test-based self-calibration
Keywords :
analogue-digital conversion; built-in self test; field programmable gate arrays; logic testing; ADC; FPGA; analog-digital converter; built-in self-test; field programmable gate arrays; polynomial fitting; test-based self-calibration; Automatic testing; Built-in self-test; Circuit testing; Field programmable gate arrays; Histograms; Linearity; Performance evaluation; Polynomials; Production; Signal generators;
Conference_Titel :
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2523-7
DOI :
10.1109/ISQED.2006.25
